Automated Localisation Testing in Industry with Test*

Mireilla Martinez; Anna I. Esparcia; Urko Rueda; Tanja E. J. Vos; Carlos Ortega

doi:10.1007/978-3-319-47443-4_17

Automated Localisation Testing in Industry with Test*

Mireilla Martinez, Anna I. Esparcia, Urko Rueda^*, Tanja E. J. Vos, Carlos Ortega

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

Original language	English
Title of host publication	Testing Software and Systems
Subtitle of host publication	28th IFIP WG 6.1 International Conference, ICTSS 2016, Graz, Austria, October 17-19, 2016, Proceedings
Editors	Franz Wotawa, Mihai Nica, Natalia Kushik
Place of Publication	Cham
Publisher	Springer International Publishing
Pages	241-248
Number of pages	8
ISBN (Electronic)	978-3-319-47443-4
ISBN (Print)	978-3-319-47442-7
DOIs	https://doi.org/10.1007/978-3-319-47443-4_17
Publication status	Published - 2016
Event	28th IFIP WG 6.1 International Conference - Graz, Austria Duration: 17 Oct 2016 → 19 Oct 2016

Publication series

Series	Lecture Notes in Computer Science
Volume	9976
ISSN	0302-9743

Conference

Conference	28th IFIP WG 6.1 International Conference
Abbreviated title	ICTSS 2016
Country/Territory	Austria
City	Graz
Period	17/10/16 → 19/10/16

Access to Document

10.1007/978-3-319-47443-4_17

Cite this

Martinez, M., Esparcia, A. I., Rueda, U., Vos, T. E. J., & Ortega, C. (2016). Automated Localisation Testing in Industry with Test*. In F. Wotawa, M. Nica, & N. Kushik (Eds.), Testing Software and Systems: 28th IFIP WG 6.1 International Conference, ICTSS 2016, Graz, Austria, October 17-19, 2016, Proceedings (pp. 241-248). Springer International Publishing. Lecture Notes in Computer Science Vol. 9976 https://doi.org/10.1007/978-3-319-47443-4_17

Martinez, Mireilla ; Esparcia, Anna I. ; Rueda, Urko et al. / Automated Localisation Testing in Industry with Test*. Testing Software and Systems: 28th IFIP WG 6.1 International Conference, ICTSS 2016, Graz, Austria, October 17-19, 2016, Proceedings. editor / Franz Wotawa ; Mihai Nica ; Natalia Kushik. Cham : Springer International Publishing, 2016. pp. 241-248 (Lecture Notes in Computer Science, Vol. 9976).

@inproceedings{05f7ff04d50c47fda0002f71234686b6,

title = "Automated Localisation Testing in Industry with Test*",

author = "Mireilla Martinez and Esparcia, {Anna I.} and Urko Rueda and Vos, {Tanja E. J.} and Carlos Ortega",

year = "2016",

doi = "10.1007/978-3-319-47443-4_17",

language = "English",

isbn = "978-3-319-47442-7",

series = "Lecture Notes in Computer Science",

publisher = "Springer International Publishing",

pages = "241--248",

editor = "Franz Wotawa and Mihai Nica and Natalia Kushik",

booktitle = "Testing Software and Systems",

address = "Switzerland",

note = "28th IFIP WG 6.1 International Conference, ICTSS 2016 ; Conference date: 17-10-2016 Through 19-10-2016",

}

Martinez, M, Esparcia, AI, Rueda, U, Vos, TEJ & Ortega, C 2016, Automated Localisation Testing in Industry with Test*. in F Wotawa, M Nica & N Kushik (eds), Testing Software and Systems: 28th IFIP WG 6.1 International Conference, ICTSS 2016, Graz, Austria, October 17-19, 2016, Proceedings. Springer International Publishing, Cham, Lecture Notes in Computer Science, vol. 9976, pp. 241-248, 28th IFIP WG 6.1 International Conference, Graz, Austria, 17/10/16. https://doi.org/10.1007/978-3-319-47443-4_17

Automated Localisation Testing in Industry with Test*. / Martinez, Mireilla; Esparcia, Anna I.; Rueda, Urko et al.
Testing Software and Systems: 28th IFIP WG 6.1 International Conference, ICTSS 2016, Graz, Austria, October 17-19, 2016, Proceedings. ed. / Franz Wotawa; Mihai Nica; Natalia Kushik. Cham: Springer International Publishing, 2016. p. 241-248 (Lecture Notes in Computer Science, Vol. 9976).

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

TY - GEN

T1 - Automated Localisation Testing in Industry with Test*

AU - Martinez, Mireilla

AU - Esparcia, Anna I.

AU - Rueda, Urko

AU - Vos, Tanja E. J.

AU - Ortega, Carlos

PY - 2016

Y1 - 2016

U2 - 10.1007/978-3-319-47443-4_17

DO - 10.1007/978-3-319-47443-4_17

M3 - Conference Article in proceeding

SN - 978-3-319-47442-7

T3 - Lecture Notes in Computer Science

SP - 241

EP - 248

BT - Testing Software and Systems

A2 - Wotawa, Franz

A2 - Nica, Mihai

A2 - Kushik, Natalia

PB - Springer International Publishing

CY - Cham

T2 - 28th IFIP WG 6.1 International Conference

Y2 - 17 October 2016 through 19 October 2016

ER -

Martinez M, Esparcia AI, Rueda U, Vos TEJ, Ortega C. Automated Localisation Testing in Industry with Test*. In Wotawa F, Nica M, Kushik N, editors, Testing Software and Systems: 28th IFIP WG 6.1 International Conference, ICTSS 2016, Graz, Austria, October 17-19, 2016, Proceedings. Cham: Springer International Publishing. 2016. p. 241-248. (Lecture Notes in Computer Science, Vol. 9976). Epub 2016 Oct 4. doi: 10.1007/978-3-319-47443-4_17