CoBRA: Low cost compensation of TSV failures in 3D-NoC

Ronak Salamat, Masoumeh Ebrahimi, Nader Bagherzadeh, F. Verbeek

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingAcademicpeer-review

Original languageEnglish
Title of host publication2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Subtitle of host publicationSeptember 19-20, 2016
Place of PublicationDanvers, MA
PublisherIEEE
Pages115-120
Number of pages6
ISBN (Electronic)9781509036233
ISBN (Print)9781509036240
DOIs
Publication statusPublished - 2016
Event2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and
Nanotechnology Systems
- University of Connecticut, Storrs, United States
Duration: 19 Sep 201620 Sep 2016

Symposium

Symposium2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and
Nanotechnology Systems
Abbreviated titleDFT 2016
CountryUnited States
CityStorrs
Period19/09/1620/09/16

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