Conformance Testing, the Elixer within the Chain for Learning Scenarios and Objects.

Rob Nadolski; Owen O'Neill; Wim van der Vegt; Rob Koper

doi:10.1109/ICALT.2006.1652445

Conformance Testing, the Elixer within the Chain for Learning Scenarios and Objects.

Rob Nadolski, Owen O'Neill, Wim van der Vegt, Rob Koper

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 6th IEEE International Conference on Advanced Learning Technologies
Subtitle of host publication	ICALT 2006
Editors	Kinshuk, Rob Koper, Piet Kommers, Paul Kirschner, Demetrios G. Sampson, Wim Didderen
Publisher	IEEE
Pages	363-365
Number of pages	3
ISBN (Print)	0-7695-2632-2
DOIs	https://doi.org/10.1109/ICALT.2006.1652445
Publication status	Published - 2006
Event	Sixth international conference on advanced learning - Kerkrade, Netherlands Duration: 5 Jul 2006 → 7 Jul 2006 Conference number: 6

Conference

Conference	Sixth international conference on advanced learning
Abbreviated title	ICALT 2006
Country/Territory	Netherlands
City	Kerkrade
Period	5/07/06 → 7/07/06

Access to Document

10.1109/ICALT.2006.1652445

Cite this

Nadolski, R., O'Neill, O., Vegt, W. V. D., & Koper, R. (2006). Conformance Testing, the Elixer within the Chain for Learning Scenarios and Objects. In Kinshuk, R. Koper, P. Kommers, P. Kirschner, D. G. Sampson, & W. Didderen (Eds.), Proceedings of the 6th IEEE International Conference on Advanced Learning Technologies: ICALT 2006 (pp. 363-365). IEEE. https://doi.org/10.1109/ICALT.2006.1652445

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title = "Conformance Testing, the Elixer within the Chain for Learning Scenarios and Objects.",

author = "Rob Nadolski and Owen O'Neill and Vegt, \{Wim van der\} and Rob Koper",

note = "DBLP License: DBLP's bibliographic metadata records provided through http://dblp.org/ are distributed under a Creative Commons CC0 1.0 Universal Public Domain Dedication. Although the bibliographic metadata records are provided consistent with CC0 1.0 Dedication, the content described by the metadata records is not. Content may be subject to copyright, rights of privacy, rights of publicity and other restrictions.; Sixth international conference on advanced learning, ICALT 2006 ; Conference date: 05-07-2006 Through 07-07-2006",

year = "2006",

doi = "10.1109/ICALT.2006.1652445",

language = "English",

isbn = " 0-7695-2632-2",

pages = "363--365",

editor = "Kinshuk and Rob Koper and Piet Kommers and Paul Kirschner and \{ Sampson\}, \{Demetrios G.\} and Didderen, \{Wim \}",

booktitle = "Proceedings of the 6th IEEE International Conference on Advanced Learning Technologies",

publisher = "IEEE",

address = "United States",

}

Nadolski, R, O'Neill, O, Vegt, WVD & Koper, R 2006, Conformance Testing, the Elixer within the Chain for Learning Scenarios and Objects. in Kinshuk, R Koper, P Kommers, P Kirschner, DG Sampson & W Didderen (eds), Proceedings of the 6th IEEE International Conference on Advanced Learning Technologies: ICALT 2006. IEEE, pp. 363-365, Sixth international conference on advanced learning, Kerkrade, Netherlands, 5/07/06. https://doi.org/10.1109/ICALT.2006.1652445

Conformance Testing, the Elixer within the Chain for Learning Scenarios and Objects. / Nadolski, Rob; O'Neill, Owen; Vegt, Wim van der et al.
Proceedings of the 6th IEEE International Conference on Advanced Learning Technologies: ICALT 2006. ed. / Kinshuk; Rob Koper; Piet Kommers; Paul Kirschner; Demetrios G. Sampson; Wim Didderen. IEEE, 2006. p. 363-365.

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

TY - GEN

T1 - Conformance Testing, the Elixer within the Chain for Learning Scenarios and Objects.

AU - Nadolski, Rob

AU - O'Neill, Owen

AU - Vegt, Wim van der

AU - Koper, Rob

N1 - Conference code: 6

PY - 2006

Y1 - 2006

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DO - 10.1109/ICALT.2006.1652445

M3 - Conference Article in proceeding

SN - 0-7695-2632-2

SP - 363

EP - 365

BT - Proceedings of the 6th IEEE International Conference on Advanced Learning Technologies

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A2 - Kommers, Piet

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A2 - Sampson, Demetrios G.

A2 - Didderen, Wim

PB - IEEE

T2 - Sixth international conference on advanced learning

Y2 - 5 July 2006 through 7 July 2006

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