Defect detection oriented lifecycle modeling in complex product development

J.H. Moll van, J.C. Jacobs, R.J. Kusters, J.J.M. Trienekens

Research output: Contribution to journal › Article › Academic › peer-review

9 Citations (Web of Science)

Original language	English
Pages (from-to)	665-675
Number of pages	11
Journal	Information and Software Technology
Volume	46
Issue number	10
DOIs	https://doi.org/10.1016/j.infsof.2003.12.001
Publication status	Published - Aug 2004
Externally published	Yes

Access to Document

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title = "Defect detection oriented lifecycle modeling in complex product development",

author = "{Moll van}, J.H. and J.C. Jacobs and R.J. Kusters and J.J.M. Trienekens",

year = "2004",

month = aug,

doi = "10.1016/j.infsof.2003.12.001",

language = "English",

volume = "46",

pages = "665--675",

journal = "Information and Software Technology",

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number = "10",

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TY - JOUR

T1 - Defect detection oriented lifecycle modeling in complex product development

AU - Moll van, J.H.

AU - Jacobs, J.C.

AU - Kusters, R.J.

AU - Trienekens, J.J.M.

PY - 2004/8

Y1 - 2004/8

U2 - 10.1016/j.infsof.2003.12.001

DO - 10.1016/j.infsof.2003.12.001

M3 - Article

SN - 0950-5849

VL - 46

SP - 665

EP - 675

JO - Information and Software Technology

JF - Information and Software Technology

IS - 10

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