Defect detection oriented lifecycle modeling in complex product development

J.H. Moll van, J.C. Jacobs, R.J. Kusters, J.J.M. Trienekens

Research output: Contribution to journal › Article › Academic › peer-review

9 Citations (Web of Science)

Original language	English
Pages (from-to)	665-675
Number of pages	11
Journal	Information and Software Technology
Volume	46
Issue number	10
DOIs	https://doi.org/10.1016/j.infsof.2003.12.001
Publication status	Published - Aug 2004
Externally published	Yes

Access to Document

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title = "Defect detection oriented lifecycle modeling in complex product development",

author = "\{Moll van\}, J.H. and J.C. Jacobs and R.J. Kusters and J.J.M. Trienekens",

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T1 - Defect detection oriented lifecycle modeling in complex product development

AU - Moll van, J.H.

AU - Jacobs, J.C.

AU - Kusters, R.J.

AU - Trienekens, J.J.M.

PY - 2004/8

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