Abstract
Clearly, in today's complex systems, hardware and software approaches to DFT must work together to achieve a successful overall solution. The authors investigate existing and new concepts that may lead to a single design for test strategy in the future.
Original language | English |
---|---|
Pages (from-to) | 79-86 |
Journal | Ieee Design & Test of Computers |
Volume | 13 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1996 |
Externally published | Yes |