Abstract
Clearly, in today's complex systems, hardware and software approaches to DFT must work together to achieve a successful overall solution. The authors investigate existing and new concepts that may lead to a single design for test strategy in the future.
| Original language | English |
|---|---|
| Pages (from-to) | 79-86 |
| Journal | Ieee Design & Test of Computers |
| Volume | 13 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1996 |
| Externally published | Yes |