Abstract
This paper presents enhanced reduced pin-count test (E-RPCT) for low-cost test. E-RPCT is an extension of traditional RPCT for circuits in which a large number of digital IC pins is multiplexed for scan. The basic concept of E-RPCT is to provide access to the internal scan chains via an IEEE 1149.1 compatible boundary-scan architecture, instead of direct access via the IC pins. The boundary-scan chain performs serial/parallel conversion of test data. E-RPCT also provides I/O wrap to test non-contacted pins. The paper presents E-RPCT for full-scan design, as well as for full-scan core-based design.
Original language | English |
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Pages (from-to) | 129-143 |
Journal | Journal of Electronic Testing: Theory and Applications |
Volume | 18 |
DOIs | |
Publication status | Published - 2002 |
Externally published | Yes |