Enhanced reduced pin-count test for full-scan design

H. Vranken; T. Waayers; H. Fleury; D. Lelouvier

doi:10.1023/A:1014989408897

Enhanced reduced pin-count test for full-scan design

H. Vranken
, T. Waayers
, H. Fleury
, D. Lelouvier

Research output: Contribution to journal › Article › Academic › peer-review

3 Citations (Web of Science)

Abstract

This paper presents enhanced reduced pin-count test (E-RPCT) for low-cost test. E-RPCT is an extension of traditional RPCT for circuits in which a large number of digital IC pins is multiplexed for scan. The basic concept of E-RPCT is to provide access to the internal scan chains via an IEEE 1149.1 compatible boundary-scan architecture, instead of direct access via the IC pins. The boundary-scan chain performs serial/parallel conversion of test data. E-RPCT also provides I/O wrap to test non-contacted pins. The paper presents E-RPCT for full-scan design, as well as for full-scan core-based design.

Original language	English
Pages (from-to)	129-143
Journal	Journal of Electronic Testing: Theory and Applications
Volume	18
DOIs	https://doi.org/10.1023/A:1014989408897
Publication status	Published - 2002
Externally published	Yes

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author = "H. Vranken and T. Waayers and H. Fleury and D. Lelouvier",

year = "2002",

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AU - Vranken, H.

AU - Waayers, T.

AU - Fleury, H.

AU - Lelouvier, D.

PY - 2002

Y1 - 2002

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AB - This paper presents enhanced reduced pin-count test (E-RPCT) for low-cost test. E-RPCT is an extension of traditional RPCT for circuits in which a large number of digital IC pins is multiplexed for scan. The basic concept of E-RPCT is to provide access to the internal scan chains via an IEEE 1149.1 compatible boundary-scan architecture, instead of direct access via the IC pins. The boundary-scan chain performs serial/parallel conversion of test data. E-RPCT also provides I/O wrap to test non-contacted pins. The paper presents E-RPCT for full-scan design, as well as for full-scan core-based design.

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JO - Journal of Electronic Testing: Theory and Applications

JF - Journal of Electronic Testing: Theory and Applications

ER -

Enhanced reduced pin-count test for full-scan design

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