| Original language | English |
|---|---|
| Title of host publication | Lifelong Technology-Enhanced Learning |
| Subtitle of host publication | EC-TEL 2018 |
| Place of Publication | Cham |
| Publisher | Springer |
| Pages | 262-276 |
| Number of pages | 15 |
| ISBN (Electronic) | 9783319985725 |
| ISBN (Print) | 9783319985718 |
| DOIs | |
| Publication status | Published - 14 Aug 2018 |
| Event | European Conference on Technology Enhanced Learning: Lifelong Technology-Enhanced Learning (EC-TEL 2018) - Leeds, United Kingdom Duration: 3 Sep 2018 → 6 Sep 2018 https://link.springer.com/conference/ectel |
Publication series
| Name | LNCS |
|---|---|
| Publisher | Springer |
| Volume | 11082 |
Conference
| Conference | European Conference on Technology Enhanced Learning |
|---|---|
| Abbreviated title | EC-TEL 2018 |
| Country | United Kingdom |
| City | Leeds |
| Period | 3/09/18 → 6/09/18 |
| Internet address |
Cite this
}
Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. / Heeren, B.J.; Jeuring, J.T.; Sosnovsky, Sergey; Drijvers, Paul; Boon, Peter; Tacoma, Sietske; Koops, Jesse; Weinberger, Armin; Grugeon-Allys, Brigitte; Chenevotot-Quentin, Francoise ; van Wijk, Jorn; van Walree, Ferdinand.
Lifelong Technology-Enhanced Learning: EC-TEL 2018. Cham : Springer, 2018. p. 262-276 (LNCS; Vol. 11082).Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceeding › Academic › peer-review
TY - GEN
T1 - Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems
AU - Heeren, B.J.
AU - Jeuring, J.T.
AU - Sosnovsky, Sergey
AU - Drijvers, Paul
AU - Boon, Peter
AU - Tacoma, Sietske
AU - Koops, Jesse
AU - Weinberger, Armin
AU - Grugeon-Allys, Brigitte
AU - Chenevotot-Quentin, Francoise
AU - van Wijk, Jorn
AU - van Walree, Ferdinand
PY - 2018/8/14
Y1 - 2018/8/14
U2 - 10.1007/978-3-319-98572-5_20
DO - 10.1007/978-3-319-98572-5_20
M3 - Conference article in proceeding
SN - 9783319985718
T3 - LNCS
SP - 262
EP - 276
BT - Lifelong Technology-Enhanced Learning
PB - Springer
CY - Cham
ER -