Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems

B.J. Heeren, J.T. Jeuring, Sergey Sosnovsky, Paul Drijvers, Peter Boon, Sietske Tacoma, Jesse Koops, Armin Weinberger, Brigitte Grugeon-Allys, Francoise Chenevotot-Quentin, Jorn van Wijk, Ferdinand van Walree

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingAcademicpeer-review

Original languageEnglish
Title of host publicationLifelong Technology-Enhanced Learning
Subtitle of host publicationEC-TEL 2018
Place of PublicationCham
PublisherSpringer
Pages262-276
Number of pages15
ISBN (Electronic)9783319985725
ISBN (Print)9783319985718
DOIs
Publication statusPublished - 14 Aug 2018
Event13th European Conference on Technology Enhanced Learning: Lifelong Technology-Enhanced Learning (EC-TEL 2018) - Leeds, United Kingdom
Duration: 3 Sep 20186 Sep 2018
https://link.springer.com/conference/ectel

Publication series

SeriesLecture Notes in Computer Science
Volume11082
ISSN0302-9743

Conference

Conference13th European Conference on Technology Enhanced Learning
Abbreviated titleEC-TEL 2018
CountryUnited Kingdom
CityLeeds
Period3/09/186/09/18
Internet address

Cite this

Heeren, B. J., Jeuring, J. T., Sosnovsky, S., Drijvers, P., Boon, P., Tacoma, S., Koops, J., Weinberger, A., Grugeon-Allys, B., Chenevotot-Quentin, F., van Wijk, J., & van Walree, F. (2018). Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. In Lifelong Technology-Enhanced Learning: EC-TEL 2018 (pp. 262-276). Springer. Lecture Notes in Computer Science, Vol.. 11082 https://doi.org/10.1007/978-3-319-98572-5_20