Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems

B.J. Heeren, J.T. Jeuring, Sergey Sosnovsky, Paul Drijvers, Peter Boon, Sietske Tacoma, Jesse Koops, Armin Weinberger, Brigitte Grugeon-Allys, Francoise Chenevotot-Quentin, Jorn van Wijk, Ferdinand van Walree

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingAcademicpeer-review

Original languageEnglish
Title of host publicationLifelong Technology-Enhanced Learning
Subtitle of host publicationEC-TEL 2018
Place of PublicationCham
PublisherSpringer
Pages262-276
Number of pages15
ISBN (Electronic)9783319985725
ISBN (Print)9783319985718
DOIs
Publication statusPublished - 14 Aug 2018
EventEuropean Conference on Technology Enhanced Learning: Lifelong Technology-Enhanced Learning (EC-TEL 2018) - Leeds, United Kingdom
Duration: 3 Sep 20186 Sep 2018
https://link.springer.com/conference/ectel

Publication series

NameLNCS
PublisherSpringer
Volume11082

Conference

ConferenceEuropean Conference on Technology Enhanced Learning
Abbreviated titleEC-TEL 2018
CountryUnited Kingdom
CityLeeds
Period3/09/186/09/18
Internet address

Cite this

Heeren, B. J., Jeuring, J. T., Sosnovsky, S., Drijvers, P., Boon, P., Tacoma, S., ... van Walree, F. (2018). Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. In Lifelong Technology-Enhanced Learning: EC-TEL 2018 (pp. 262-276). (LNCS; Vol. 11082). Cham: Springer. https://doi.org/10.1007/978-3-319-98572-5_20
Heeren, B.J. ; Jeuring, J.T. ; Sosnovsky, Sergey ; Drijvers, Paul ; Boon, Peter ; Tacoma, Sietske ; Koops, Jesse ; Weinberger, Armin ; Grugeon-Allys, Brigitte ; Chenevotot-Quentin, Francoise ; van Wijk, Jorn ; van Walree, Ferdinand. / Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. Lifelong Technology-Enhanced Learning: EC-TEL 2018. Cham : Springer, 2018. pp. 262-276 (LNCS).
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title = "Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems",
author = "B.J. Heeren and J.T. Jeuring and Sergey Sosnovsky and Paul Drijvers and Peter Boon and Sietske Tacoma and Jesse Koops and Armin Weinberger and Brigitte Grugeon-Allys and Francoise Chenevotot-Quentin and {van Wijk}, Jorn and {van Walree}, Ferdinand",
year = "2018",
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doi = "10.1007/978-3-319-98572-5_20",
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Heeren, BJ, Jeuring, JT, Sosnovsky, S, Drijvers, P, Boon, P, Tacoma, S, Koops, J, Weinberger, A, Grugeon-Allys, B, Chenevotot-Quentin, F, van Wijk, J & van Walree, F 2018, Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. in Lifelong Technology-Enhanced Learning: EC-TEL 2018. LNCS, vol. 11082, Springer, Cham, pp. 262-276, European Conference on Technology Enhanced Learning, Leeds, United Kingdom, 3/09/18. https://doi.org/10.1007/978-3-319-98572-5_20

Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. / Heeren, B.J.; Jeuring, J.T.; Sosnovsky, Sergey; Drijvers, Paul; Boon, Peter; Tacoma, Sietske; Koops, Jesse; Weinberger, Armin; Grugeon-Allys, Brigitte; Chenevotot-Quentin, Francoise ; van Wijk, Jorn; van Walree, Ferdinand.

Lifelong Technology-Enhanced Learning: EC-TEL 2018. Cham : Springer, 2018. p. 262-276 (LNCS; Vol. 11082).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingAcademicpeer-review

TY - GEN

T1 - Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems

AU - Heeren, B.J.

AU - Jeuring, J.T.

AU - Sosnovsky, Sergey

AU - Drijvers, Paul

AU - Boon, Peter

AU - Tacoma, Sietske

AU - Koops, Jesse

AU - Weinberger, Armin

AU - Grugeon-Allys, Brigitte

AU - Chenevotot-Quentin, Francoise

AU - van Wijk, Jorn

AU - van Walree, Ferdinand

PY - 2018/8/14

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DO - 10.1007/978-3-319-98572-5_20

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SN - 9783319985718

T3 - LNCS

SP - 262

EP - 276

BT - Lifelong Technology-Enhanced Learning

PB - Springer

CY - Cham

ER -

Heeren BJ, Jeuring JT, Sosnovsky S, Drijvers P, Boon P, Tacoma S et al. Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. In Lifelong Technology-Enhanced Learning: EC-TEL 2018. Cham: Springer. 2018. p. 262-276. (LNCS). https://doi.org/10.1007/978-3-319-98572-5_20