Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems

B.J. Heeren; J.T. Jeuring; Sergey Sosnovsky; Paul Drijvers; Peter Boon; Sietske Tacoma; Jesse  Koops; Armin Weinberger; Brigitte Grugeon-Allys; Francoise  Chenevotot-Quentin; Jorn van Wijk; Ferdinand van Walree

doi:10.1007/978-3-319-98572-5_20

Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems

B.J. Heeren, J.T. Jeuring, Sergey Sosnovsky, Paul Drijvers, Peter Boon, Sietske Tacoma, Jesse Koops, Armin Weinberger, Brigitte Grugeon-Allys, Francoise Chenevotot-Quentin, Jorn van Wijk, Ferdinand van Walree

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

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Original language	English
Title of host publication	Lifelong Technology-Enhanced Learning
Subtitle of host publication	EC-TEL 2018
Place of Publication	Cham
Publisher	Springer
Pages	262-276
Number of pages	15
ISBN (Electronic)	9783319985725
ISBN (Print)	9783319985718
DOIs	https://doi.org/10.1007/978-3-319-98572-5_20
Publication status	Published - 14 Aug 2018
Event	13th European Conference on Technology Enhanced Learning: Lifelong Technology-Enhanced Learning (EC-TEL 2018) - Leeds, United Kingdom Duration: 3 Sep 2018 → 6 Sep 2018 https://link.springer.com/conference/ectel

Publication series

Series	Lecture Notes in Computer Science
Volume	11082
ISSN	0302-9743

Conference

Conference	13th European Conference on Technology Enhanced Learning
Abbreviated title	EC-TEL 2018
Country/Territory	United Kingdom
City	Leeds
Period	3/09/18 → 6/09/18
Internet address	https://link.springer.com/conference/ectel

Access to Document

10.1007/978-3-319-98572-5_20

Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story ProblemsFinal published version, 1.76 MBLicence: Taverne

Cite this

Heeren, B. J., Jeuring, J. T., Sosnovsky, S., Drijvers, P., Boon, P., Tacoma, S., Koops, J., Weinberger, A., Grugeon-Allys, B., Chenevotot-Quentin, F., van Wijk, J., & van Walree, F. (2018). Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. In Lifelong Technology-Enhanced Learning: EC-TEL 2018 (pp. 262-276). Springer. Lecture Notes in Computer Science Vol. 11082 https://doi.org/10.1007/978-3-319-98572-5_20

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title = "Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems",

author = "B.J. Heeren and J.T. Jeuring and Sergey Sosnovsky and Paul Drijvers and Peter Boon and Sietske Tacoma and Jesse Koops and Armin Weinberger and Brigitte Grugeon-Allys and Francoise Chenevotot-Quentin and {van Wijk}, Jorn and {van Walree}, Ferdinand",

year = "2018",

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doi = "10.1007/978-3-319-98572-5_20",

language = "English",

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series = "Lecture Notes in Computer Science",

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pages = "262--276",

booktitle = "Lifelong Technology-Enhanced Learning",

note = "13th European Conference on Technology Enhanced Learning : Lifelong Technology-Enhanced Learning (EC-TEL 2018), EC-TEL 2018 ; Conference date: 03-09-2018 Through 06-09-2018",

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Heeren, BJ, Jeuring, JT, Sosnovsky, S, Drijvers, P, Boon, P, Tacoma, S, Koops, J, Weinberger, A, Grugeon-Allys, B, Chenevotot-Quentin, F, van Wijk, J & van Walree, F 2018, Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. in Lifelong Technology-Enhanced Learning: EC-TEL 2018. Springer, Cham, Lecture Notes in Computer Science, vol. 11082, pp. 262-276, 13th European Conference on Technology Enhanced Learning, Leeds, United Kingdom, 3/09/18. https://doi.org/10.1007/978-3-319-98572-5_20

Fine-Grained Cognitive Assessment Based on Free-Form Input for Math Story Problems. / Heeren, B.J.; Jeuring, J.T.; Sosnovsky, Sergey et al.

Lifelong Technology-Enhanced Learning: EC-TEL 2018. Cham : Springer, 2018. p. 262-276 (Lecture Notes in Computer Science, Vol. 11082).

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

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AU - Tacoma, Sietske

AU - Koops, Jesse

AU - Weinberger, Armin

AU - Grugeon-Allys, Brigitte

AU - Chenevotot-Quentin, Francoise

AU - van Wijk, Jorn

AU - van Walree, Ferdinand

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