GUI-Profiling for Performance and Coverage Analysis

Nico Beierle; Peter M.  Kruse; Tanja E.J. Vos

doi:10.1109/ISSREW.2017.78

GUI-Profiling for Performance and Coverage Analysis

Nico Beierle
, Peter M. Kruse
, Tanja E.J. Vos

Research Line Resilience (part of LIRS program)

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

Original language	English
Title of host publication	Proceedings 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops
Subtitle of host publication	23–26 October 2017 Toulouse, France
Editors	Lisa O’Conner
Place of Publication	Los Alamitos, California; Washington; Tokyo
Publisher	IEEE Computer Society Press
Pages	28-31
Number of pages	4
ISBN (Print)	9781538623879
DOIs	https://doi.org/10.1109/ISSREW.2017.78
Publication status	Published - 2017

Access to Document

10.1109/ISSREW.2017.78

https://tanjavos.com/wp-content/uploads/2018/02/PID4950993-new.pdf

Cite this

@inproceedings{99b218fd7235477b8ec054ccb0c5d13c,

title = "GUI-Profiling for Performance and Coverage Analysis",

author = "Nico Beierle and Kruse, \{Peter M.\} and Vos, \{Tanja E.J.\}",

year = "2017",

doi = "10.1109/ISSREW.2017.78",

language = "English",

isbn = "9781538623879",

pages = "28--31",

editor = "Lisa O{\textquoteright}Conner",

booktitle = "Proceedings 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops",

publisher = "IEEE Computer Society Press",

}

Beierle, N, Kruse, PM & Vos, TEJ 2017, GUI-Profiling for Performance and Coverage Analysis. in L O’Conner (ed.), Proceedings 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops: 23–26 October 2017 Toulouse, France. IEEE Computer Society Press, Los Alamitos, California; Washington; Tokyo, pp. 28-31. https://doi.org/10.1109/ISSREW.2017.78

GUI-Profiling for Performance and Coverage Analysis. / Beierle, Nico; Kruse, Peter M. ; Vos, Tanja E.J.
Proceedings 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops: 23–26 October 2017 Toulouse, France. ed. / Lisa O’Conner. Los Alamitos, California; Washington; Tokyo: IEEE Computer Society Press, 2017. p. 28-31.

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

TY - GEN

T1 - GUI-Profiling for Performance and Coverage Analysis

AU - Beierle, Nico

AU - Kruse, Peter M.

AU - Vos, Tanja E.J.

PY - 2017

Y1 - 2017

U2 - 10.1109/ISSREW.2017.78

DO - 10.1109/ISSREW.2017.78

M3 - Conference Article in proceeding

SN - 9781538623879

SP - 28

EP - 31

BT - Proceedings 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops

A2 - O’Conner, Lisa

PB - IEEE Computer Society Press

CY - Los Alamitos, California; Washington; Tokyo

ER -