Impact of test point insertion on silicon area and timing during layout

This paper presents an experimental investigation on the impact of test point insertion on circuit size and performance. Often test points are inserted into a circuit in order to improve the circuit's testability, which results in smaller test data volume, shorter test time, and higher fault coverage. Inserting test points however requires additional silicon area and influences the timing of a circuit. The paper shows how placement and routing is affected by test point insertion during layout generation. Experimental data for industrial circuits show that inserting 1% test points in general increases the silicon area after layout by less than 0.5% while the performance of the circuit may be reduced by 5% or more.