Original language | English |
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Title of host publication | Cross-cultural analysis |
Subtitle of host publication | Methods and Applications |
Editors | Eldad Davidov, Peter Schmidt, Jaak Billiet |
Place of Publication | New York, USA |
Publisher | Routledge |
Chapter | 9 |
Pages | 249-278 |
Number of pages | 30 |
ISBN (Print) | 978-1-84872-823-3, 978-1-84872-822-6 |
Publication status | Published - 2011 |
Externally published | Yes |
Measurement Equivalence of the Dispositional Resistance to Change Scale
S. Oreg, Mahmut Bayazit, M. Vakola, Luis Arciniega, Achilles Armenakis, Rasa Barkauskiene, Nikos Bozionelos, Yuka Fujimoto, Luis González, Jian Han, Martina Hřebίčková, Nerina Jimmieson, Jana Kordačová, Hitoshi Mitsuhashi, Boris Mlačić, Ivana Ferić, Marina Kotrla Topić, Sandra Ohly, Per Øystein Saksvik, Hilde Hetland
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Professional