| Original language | English |
|---|---|
| Title of host publication | Cross-cultural analysis |
| Subtitle of host publication | Methods and Applications |
| Editors | Eldad Davidov, Peter Schmidt, Jaak Billiet |
| Place of Publication | New York, USA |
| Publisher | Routledge |
| Chapter | 9 |
| Pages | 249-278 |
| Number of pages | 30 |
| ISBN (Print) | 978-1-84872-823-3, 978-1-84872-822-6 |
| Publication status | Published - 2011 |
| Externally published | Yes |
Measurement Equivalence of the Dispositional Resistance to Change Scale
- S. Oreg
- , Mahmut Bayazit
- , M. Vakola
- , Luis Arciniega
- , Achilles Armenakis
- , Rasa Barkauskiene
- , Nikos Bozionelos
- , Yuka Fujimoto
- , Luis González
- , Jian Han
- , Martina Hřebίčková
- , Nerina Jimmieson
- , Jana Kordačová
- , Hitoshi Mitsuhashi
- , Boris Mlačić
- , Ivana Ferić
- , Marina Kotrla Topić
- , Sandra Ohly
- , Per Øystein Saksvik
- , Hilde Hetland
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Professional