n-Complete Test Suites for IOCO

Petra van den Bos; Ramon Janssen; Joshua Moerman

doi:10.1007/978-3-319-67549-7_6

n-Complete Test Suites for IOCO

Petra van den Bos^*
, Ramon Janssen
, Joshua Moerman

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

Abstract

An n-complete test suite for automata guarantees to detect all faulty implementations with a bounded number of states. This principle is well-known when testing FSMs for equivalence, but the problem becomes harder for ioco conformance on labeled transitions systems. Existing methods restrict the structure of specifications and implementations. We eliminate those restrictions, using only the number of implementation states, and fairness in test execution. We provide a formalization, a construction and a correctness proof for n-complete test suites for ioco.

Original language	English
Title of host publication	Testing Software and Systems
Subtitle of host publication	29th IFIP WG 6.1 International Conference, ICTSS 2017, St. Petersburg, Russia, October 9-11, 2017, Proceedings
Publisher	Springer
Pages	91-107
Number of pages	17
ISBN (Print)	978-3-319-67548-0
DOIs	https://doi.org/10.1007/978-3-319-67549-7_6
Publication status	Published - Sept 2017
Externally published	Yes
Event	International Conference on Testing Software and Systems - St. Petersburg, Russian Federation Duration: 9 Oct 2017 → 11 Oct 2017 https://link.springer.com/book/10.1007/978-3-319-67549-7

Publication series

Series	Lecture Notes in Computer Science
Volume	10533
ISSN	0302-9743

Conference

Conference	International Conference on Testing Software and Systems
Abbreviated title	ICTSS 2017
Country/Territory	Russian Federation
City	St. Petersburg
Period	9/10/17 → 11/10/17
Internet address	https://link.springer.com/book/10.1007/978-3-319-67549-7

Access to Document

10.1007/978-3-319-67549-7_6

n-Complete test suites for IOCO
Bos, P. V. D., Janssen, R. & Moerman, J., 15 Jun 2019, In: Software Quality Journal. 27, 2, p. 563-588 26 p.
Research output: Contribution to journal › Article › Academic › peer-review

Open Access

Cite this

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title = "n-Complete Test Suites for IOCO",

abstract = "An n-complete test suite for automata guarantees to detect all faulty implementations with a bounded number of states. This principle is well-known when testing FSMs for equivalence, but the problem becomes harder for ioco conformance on labeled transitions systems. Existing methods restrict the structure of specifications and implementations. We eliminate those restrictions, using only the number of implementation states, and fairness in test execution. We provide a formalization, a construction and a correctness proof for n-complete test suites for ioco.",

author = "Bos, \{Petra van den\} and Ramon Janssen and Joshua Moerman",

note = "DBLP License: DBLP's bibliographic metadata records provided through http://dblp.org/ are distributed under a Creative Commons CC0 1.0 Universal Public Domain Dedication. Although the bibliographic metadata records are provided consistent with CC0 1.0 Dedication, the content described by the metadata records is not. Content may be subject to copyright, rights of privacy, rights of publicity and other restrictions.; International Conference on Testing Software and Systems, ICTSS 2017 ; Conference date: 09-10-2017 Through 11-10-2017",

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doi = "10.1007/978-3-319-67549-7\_6",

language = "English",

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series = "Lecture Notes in Computer Science",

publisher = "Springer",

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Bos, PVD, Janssen, R & Moerman, J 2017, n-Complete Test Suites for IOCO. in Testing Software and Systems: 29th IFIP WG 6.1 International Conference, ICTSS 2017, St. Petersburg, Russia, October 9-11, 2017, Proceedings. Springer, Lecture Notes in Computer Science, vol. 10533, pp. 91-107, International Conference on Testing Software and Systems, St. Petersburg, Russian Federation, 9/10/17. https://doi.org/10.1007/978-3-319-67549-7_6

n-Complete Test Suites for IOCO. / Bos, Petra van den; Janssen, Ramon; Moerman, Joshua.
Testing Software and Systems: 29th IFIP WG 6.1 International Conference, ICTSS 2017, St. Petersburg, Russia, October 9-11, 2017, Proceedings. Springer, 2017. p. 91-107 (Lecture Notes in Computer Science, Vol. 10533).

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

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N1 - DBLP License: DBLP's bibliographic metadata records provided through http://dblp.org/ are distributed under a Creative Commons CC0 1.0 Universal Public Domain Dedication. Although the bibliographic metadata records are provided consistent with CC0 1.0 Dedication, the content described by the metadata records is not. Content may be subject to copyright, rights of privacy, rights of publicity and other restrictions.

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n-Complete Test Suites for IOCO

Abstract

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Research output

n-Complete test suites for IOCO

Cite this