Overview of the ICST International Software Testing Contest

Emil Alégroth, Shinsuke Matsuki, Tanja E.J. Vos, Kinji Akemine

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings 10th IEEE International Conference on Software Testing, Verification and Validation
Subtitle of host publicationICST 2017, 13–17 March Tokyo, Japan
Place of PublicationPiscataway, NJ
PublisherIEEE Computer Society Press
Pages550-551
Number of pages2
ISBN (Print)9781509060313
DOIs
Publication statusPublished - 2017

Cite this

Alégroth, E., Matsuki, S., Vos, T. E. J., & Akemine, K. (2017). Overview of the ICST International Software Testing Contest. In Proceedings 10th IEEE International Conference on Software Testing, Verification and Validation : ICST 2017, 13–17 March Tokyo, Japan (pp. 550-551). IEEE Computer Society Press. https://doi.org/10.1109/ICST.2017.67