Redundancy modelling and array yield analysis for repairable embedded memories

A. Sehgal, A. Dubey, E.J. Marinissen, C. Wouters, Hendrikus Vranken, K. Chakrabarty

Research output: Contribution to journal › Article › Academic › peer-review

10 Citations (Web of Science)

Original language	English
Pages (from-to)	97-106
Journal	Iee Proceedings-Computers and Digital Techniques
Volume	152
Issue number	1
DOIs	https://doi.org/10.1049/ip-cdt:20045018
Publication status	Published - 2005

Access to Document

@article{977729d4dc854138bd5ecbc98ebe0adc,

title = "Redundancy modelling and array yield analysis for repairable embedded memories",

author = "A. Sehgal and A. Dubey and E.J. Marinissen and C. Wouters and Hendrikus Vranken and K. Chakrabarty",

year = "2005",

doi = "10.1049/ip-cdt:20045018",

language = "English",

volume = "152",

pages = "97--106",

journal = "Iee Proceedings-Computers and Digital Techniques",

issn = "1350-2387",

publisher = "Institute of Electrical Engineers",

number = "1",

}

TY - JOUR

T1 - Redundancy modelling and array yield analysis for repairable embedded memories

AU - Sehgal, A.

AU - Dubey, A.

AU - Marinissen, E.J.

AU - Wouters, C.

AU - Vranken, Hendrikus

AU - Chakrabarty, K.

PY - 2005

Y1 - 2005

U2 - 10.1049/ip-cdt:20045018

DO - 10.1049/ip-cdt:20045018

M3 - Article

SN - 1350-2387

VL - 152

SP - 97

EP - 106

JO - Iee Proceedings-Computers and Digital Techniques

JF - Iee Proceedings-Computers and Digital Techniques

IS - 1

ER -