TY - GEN
T1 - What do we know about the defect types detected in conceptual models?
AU - Granda, Maria Fernanda
AU - Condori-Fernandez, Nelly
AU - Vos, Tanja E.J.
AU - Pastor, Oscar
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/6/19
Y1 - 2015/6/19
N2 - In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have reported on defect types at model level, there still does not exist a clear and complete overview of the defect types that occur at the abstraction level. This paper presents a systematic mapping study to identify the model defect types reported in the literature and determine how they have been detected. Among the 282 articles published in software engineering area, 28 articles were selected for analysis. A total of 226 defects were identified, classified and their results analysed. For this, an appropriate defect classification scheme was built based on appropriate dimensions for models in an MDD context.
AB - In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have reported on defect types at model level, there still does not exist a clear and complete overview of the defect types that occur at the abstraction level. This paper presents a systematic mapping study to identify the model defect types reported in the literature and determine how they have been detected. Among the 282 articles published in software engineering area, 28 articles were selected for analysis. A total of 226 defects were identified, classified and their results analysed. For this, an appropriate defect classification scheme was built based on appropriate dimensions for models in an MDD context.
KW - Conceptual Schema Defects
KW - Defect Classification Scheme
KW - Model-Driven Development
KW - Systematic Mapping Study
U2 - 10.1109/RCIS.2015.7128867
DO - 10.1109/RCIS.2015.7128867
M3 - Conference Article in proceeding
AN - SCOPUS:84937942055
T3 - Proceedings of the International Conference on Research Challenges in Information Science, RCIS
SP - 88
EP - 99
BT - IEEE RCIS 2015 - 9th International Conference on Research Challenges in Information Science, Proceedings
A2 - Rolland, Colette
A2 - Anagnostopoulos, Dimosthenis
A2 - Loucopoulos, Pericles
A2 - Gonzales-Perez, Cesar
PB - IEEE Computer Society Press
T2 - 9th IEEE International Conference on Research Challenges in Information Science, IEEE RCIS 2015
Y2 - 13 May 2015 through 15 May 2015
ER -