X-masking during logic BIST and Its impact on defect coverage

Y. Tang, H.-J. Wunderlich, H. Vranken, F. Hapke, M. Wittke, P. Engelke, I. Polian, B. Becker

Research output: Chapter in Book/Report/Conference proceedingConference Article in proceedingAcademicpeer-review


We present a technique for making a circuit ready for logic BIST by masking unknown values at its outputs. In order to keep the silicon area cost low, some known bits in output responses are also allowed to be masked. These bits are selected based on a stuck-at n-detection based metric, such that the impact of masking on the defect coverage is minimal. An analysis based on a probabilistic model for resistive short defects indicates that the coverage loss for unmodeled defects is negligible for relatively low values of n.
Original languageEnglish
Title of host publicationProceedings - International Test Conference
Publication statusPublished - 2004
Externally publishedYes


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