X-masking during logic BIST and Its impact on defect coverage
- Y. Tang
- , H.-J. Wunderlich
- , H. Vranken
- , F. Hapke
- , M. Wittke
- , P. Engelke
- , I. Polian
- , B. Becker
Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review