X-masking during logic BIST and Its impact on defect coverage

  • Y. Tang
  • , H.-J. Wunderlich
  • , H. Vranken
  • , F. Hapke
  • , M. Wittke
  • , P. Engelke
  • , I. Polian
  • , B. Becker

Research output: Chapter in Book/Report/Conference proceeding › Conference Article in proceeding › Academic › peer-review

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Keyphrases

Material Science

Engineering